By Topic

Electron Transport at the Interface Between a Ferromagnetic Insulator and a Topological Insulator

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Ma, M.J. ; Electr. & Comput. Eng. Dept., Nat. Univ. of Singapore, Singapore, Singapore ; Jalil, M.B.A. ; Tan, S.G. ; Siu, Z.B.

We perform a theoretical study of the electron transport through a normal metal-topological insulator-normal metal (NM-TI-NM) system, where a ferromagnetic insulator (FI) layer is deposited on top of the TI. The spin conductance of the system is analyzed as a function of parameters such as the strength of exchange coupling between the surface states of the TI and the magnetic moments of the FI layer, as well as the dimension of the TI channel. We find that the strength of the spin conductance can be optimized by tuning the parameters.

Published in:

Magnetics, IEEE Transactions on  (Volume:48 ,  Issue: 11 )