Cart (Loading....) | Create Account
Close category search window
 

Effect of Annealing Process on Strain-Induced Crystallographic Orientation of FePt Thin Films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Hsiao, S.N. ; Dept. of Mater. Sci. & Eng., Feng Chia Univ., Taichung, Taiwan ; Liu, S.H. ; Chen, S.K. ; Lee, H.Y.

Dependence of the crystallographic orientation on annealing process (post- and in-situ annealing) of in the 40-nm-thick single-layered FePt films fabricated by magnetron sputtering onto glass substrates have been investigated. The progress of L10 ordering for both series of samples is nearly the same, verified by X-ray diffraction. For the post-annealing films, there is a dramatic change of crystallographic orientation from (111) to (001) planes with an increase of temperature from 350 °C to 700 °C. On the contrary, the orientation evolves from a (111) texture to isotropic state for the in-situ annealing samples in the same temperature range. The different atomic mobility during annealing leads to a discrepancy in the residual stress behavior and microstructure, which further causes the disparity of crystallographic orientation.

Published in:

Magnetics, IEEE Transactions on  (Volume:48 ,  Issue: 11 )

Date of Publication:

Nov. 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.