Cart (Loading....) | Create Account
Close category search window

Characterization of Organic Thin Films on Ferromagnetic Substrates by Spectroscopic Ellipsometry and Magneto-Optical Kerr Effect Spectroscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
Fronk, M. ; Inst. of Phys., Chemnitz Univ. of Technol., Chemnitz, Germany ; Schubert, C. ; Haidu, F. ; Scarlat, C.
more authors

We report the characterization of metal-phthalocyanine (CuPc and CoPc) thin films prepared on magnetic substrates by spectroscopic ellipsometry (SE) and magneto-optical Kerr effect (MOKE) spectroscopy. CuPc films were prepared on lanthanum strontium manganite (LSMO) substrates while CoPc was deposited onto Co/Pt layer systems. We address the challenge to distinguish between the dominating magneto-optical response of the magnetic substrate and the contribution of the phthalocyanine layers. The procedure is demonstrated for CuPc on LSMO and also applied to CoPc on Co/Pt. The resulting spectral contribution of the organic films is compared to modeled spectra deduced from optical model calculations based on data previously obtained from phthalocyanines on silicon substrates. For CoPc on Co/Pt the average tilt angle of the molecular plane with respect to the substrate plane is estimated to be 73 ° from the ellipsometry data evaluation.

Published in:

Magnetics, IEEE Transactions on  (Volume:48 ,  Issue: 11 )

Date of Publication:

Nov. 2012

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.