Referenced Items are not available for this document.
A surface-potential-based model is developed for the symmetric long-channel junctionless double-gate MOSFET. The relationships between surface potential and gate voltage are derived from some effective approximations to Poisson's equation for deep depletion, partial depletion, and accumulation conditions. Then, the Pao-Sah integral is carried out to obtain the drain current. It is shown that the model is in good agreement with numerical simulations from subthreshold to saturation region. Finally, we discuss the strengths and limitations (i.e., threshold voltage shifts) of the JLFET, which has been recently proposed as a promising candidate for the JFET.
Published in:
Electron Devices, IEEE Transactions on
(Volume:59
,
Issue:
12
)
Date of Publication: Dec. 2012
- Page(s):
- 3292 - 3298
- ISSN :
- 0018-9383
- INSPEC Accession Number:
- 13136095
- Digital Object Identifier :
- 10.1109/TED.2012.2221164
- Product Type:
- Journals & Magazines
- Date of Publication :
- 18 October 2012
- Date of Current Version :
- 16 November 2012
- Issue Date :
- Dec. 2012
- Sponsored by :
- IEEE Electron Devices Society
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