By Topic

28-nm HKMG GHz digital sensor for detecting dynamic voltage drops in testing for peak power optimization

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Igarashi, M. ; Design Platform Dev. Div., Renesas Electron. Corp., Tokyo, Japan ; Takeuchi, K. ; Takazawa, Y. ; Igarashi, Y.
more authors

We propose a dynamic voltage-drop sensor, which is fully digital so that it is easy to design into products and use for testing. The 2.4K-gate GHz sensor exploits the difference in the voltage sensitivity between two paths composed of different types of standard cells. We have fabricated a test chip in a 28-nm HKMG process and confirmed its feasibility. This sensor can be used to evaluate optimal activity rates and peak power in scan testing.

Published in:

Custom Integrated Circuits Conference (CICC), 2012 IEEE

Date of Conference:

9-12 Sept. 2012