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Total dose radiation testing of the Intel 80386DX microprocessor and 80387DX math coprocessor using a personal computer motherboard for the test fixture

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1 Author(s)
Mulford, S.G. ; Equipment Div., Raytheon Co., Sudbury, MA, USA

Total dose small sample evaluation (SSE) testing of the Intel 80386DX 32 bit microprocessor and 80387DX 32 bit math coprocessor has been performed using an AT IBM based personal computer. A quantity of three 80386DX devices and five 80387DX devices were used for the test. All testing was performed with the AT motherboard as the test fixture. The dose rates achieved for the tests were 0.3 krads (Si)/min for the 80368DX and 0.4 krads (Si)/min for the 80387DX. The test temperature was 25 degrees Celsius and the clock frequency was 40 MHz for the 80386DX and 30 MHz for the 80387DX. The critical parameter monitored for these devices was functionality. The mean failure level for the 80386DX devices was found to be 11.4 krads (Si). The mean failure level for the 80387DX devices was found to be 13.7 krads (Si).

Published in:

Radiation Effects Data Workshop, 1994 IEEE

Date of Conference:

20 July 1994