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Estimation and compensation of subpixel edge localization error

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3 Author(s)
Pedersini, F. ; Dipt. di Elettronica e Inf., Politecnico di Milano, Italy ; Sarti, A. ; Tubaro, S.

We propose and analyze a method for improving the performance of subpixel edge localization (EL) techniques through compensation of the systematic portion of the localization error. The method is based on the estimation of the EL characteristic through statistical analysis of a test image and is independent of the EL technique in use

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Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:19 ,  Issue: 11 )