Cart (Loading....) | Create Account
Close category search window
 

A measurement-based path loss model for wireless links in mobile ad-hoc networks (MANET) operating in the VHF and UHF band

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Fischer, J. ; Friedrich-Alexander-Univ. Erlangen-Nurnberg, Erlangen, Germany ; Grossmann, M. ; Felber, W. ; Landmann, M.
more authors

For the development of future mobile-to-mobile communication systems, realistic channel models are required. Available models are aiming at broadcasting applications using high antenna towers and are therefore not applicable for mobile-to-mobile applications like mobile ad-hoc networks (MANET). In this paper, measurements of the path loss using car-mounted receiver and transmitter antennas are presented. Based on the measurement results, a new path loss model is proposed. It is shown that this model provides a more realistic prediction of the path loss for MANET systems in the VHF and UHF band than the widely used Okumura-Hata model.

Published in:

Antennas and Propagation in Wireless Communications (APWC), 2012 IEEE-APS Topical Conference on

Date of Conference:

2-7 Sept. 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.