Cart (Loading....) | Create Account
Close category search window
 

Capturing and Tracking Performance of Patent Portfolio Using h -Complement Area Centroid

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Chung-Huei Kuan ; Grad. Inst. of Patent, Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan ; Mu-Hsuan Huang ; Dar-Zen Chen

Assuming that only the bibliometric information contained in patent databases is available and that the citations received by a patent indicate the patent's value or quality, we propose to characterize the performance of a patent assignee's patent portfolio, in terms of both the quantity and quality of its cited and uncited patents, by the centroid of a so-called h-complement area from the assignee's citation distribution. This approach is capable of producing a snapshot to a large number of assignees' portfolio performance by simultaneously depicting their h-complement area centroids in a 2-D graph. With this 2-D view, these assignees' relative performance, where the performance difference lies, and the degree of such difference can also be quickly determined. In addition, a trajectory manifesting the evolution of an assignee's portfolio performance over a window of time can be obtained by connecting the h-complement area centroids at successive epochs within the time window. The pattern revealed by the trajectory provides significant insight into how the assignee's portfolio performance has varied over time. When there is some abrupt pattern change, an analyst should be alarmed to conduct further investigation. A steady pattern, on the other hand, allows forecast to the assignee's future performance.

Published in:

Engineering Management, IEEE Transactions on  (Volume:60 ,  Issue: 3 )

Date of Publication:

Aug. 2013

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.