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We show that a commercial atomic force microscope can be used at room temperature as a detector throughout the infrared spectrum simply by recording the induced oscillation of its cantilever after irradiation by a pulsed laser. The oscillation amplitude can be made larger by spraying an absorbing graphite layer on the tip side. We demonstrate that its good sensitivity is due to a bilayer effect: their different thermal expansion coefficient forcing them to bend under irradiation. For the far-infrared spectral range, this device avoids the use of Helium cooled detectors and their numerous constraints.
Published in:
Applied Physics Letters
(Volume:101
,
Issue:
14
)
Date of Publication: Oct 2012
- Page(s):
- 141117 - 141117-3
- ISSN :
- 0003-6951
- Digital Object Identifier :
- 10.1063/1.4757606
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 08 October 2012
- Issue Date :
- Oct 2012
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