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Concurrent simulation of nearly identical digital networks

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2 Author(s)
Ulrich, E.G. ; GTE Laboratories Inc. ; Baker, T.

Test patterns for testing digital circuits are usually checked on a test verification program to determine if all or most of the possible faults will be detected. Historically, such a test verification program would be accomplished with many simulations: one for each possible fault.

Published in:

Computer  (Volume:7 ,  Issue: 4 )