By Topic

Robust controlled manipulation of nanoparticles using atomic force microscope

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $33
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
M. H. Korayem ; Robotic Research Laboratory, Center of Excellence in Experimental Solid Mechanics and Dynamics, School of Mechanical Engineering, Iran University of Science and Technology, Tehran, Iran ; E. Omidi

Atomic force microscopes have been widely used for nanomanipulation in recent years. Since the task of nanomanipulation is tedious for humans, and it is desirable to have a proficient process, controlled manipulation in nanoscale is an extremely important issue. In this Letter, a compatible nanomanipulation model consisting of all effective phenomena in nanoscale for manipulation by variant substrate motion profile is proposed to perform an accurate manipulation task. The dynamic model of nanoparticle displacement utilises the Lund-Grenoble friction model, depicting the true stick-slip behaviour of the nanoparticle in manipulation. The sliding mode control approach is used to overcome the challenges in piezoelectric substrate motion control. It compensates drift, hysteresis and other uncertainties, to provide the desired substrate motion trajectory with the desired error dynamics. The final automated process provides satisfactory results with respect to experiments and enables automated manipulation, with associated savings in time and labour, and increased complexity of the resulting created structures.

Published in:

IET Micro & Nano Letters  (Volume:7 ,  Issue: 9 )