Cart (Loading....) | Create Account
Close category search window
 

Integrated electrical and optical characterization of large area thin film photovoltaic materials

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
Szitasi, G. ; Semilab Semicond. Phys. Lab. Co. Ltd., Budapest, Hungary ; Korsos, F. ; Selmeczi, D. ; Takacs, O.
more authors

In thin film photovoltaic manufacturing, a number of different technologies are now used on an industrial scale: silicon-based thin films, CIS/CIGS-based thin films, CdTe-based films and other, more exotic materials and structures. Both during research and production control, there is a need for suitable characterization methods which can be applied directly to the panels in production. In this paper we present a range of advanced electrical and optical metrology techniques suitable for such thin film characterization. These measurements utilize a number of non-contact, non-destructive probes to determine material properties, and can be configured in a single flexible platform, to handle the large area substrates used in thin film production. We also present significant improvements achieved in the spectrally resolved haze and transmission measurements, where the improvement is the creation of an optical setup with a suitable integration sphere that enables these measurements without the usual need to measure a reference sample before the actual sample qualification, thus maintaining the advantages of an integrating sphere but reducing usual measurement time.

Published in:

Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE

Date of Conference:

3-8 June 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.