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This paper is based on structured light measurement, though a CCD camera and dual word line semiconductor lasers achieve the measurement of small surface in a close distance. The laser information extraction use threshold separation and accumulation decision for extraction of the high-precision strip center. It increases the measurement accuracy while reducing the computational complexity. Finally, the surface information obtains more complete surface information by three-dimensional image stitching. The experiments show that the measurement results with good accuracy and good practical value.
Date of Conference: 23-25 Aug. 2012