By Topic

Cathodoluminescence and Spatial Variation in Mobility-Lifetime (\mu \tau ) Product in Bulk Doped Thallium Bromide

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
David J. Phillips ; Physics Department, Naval Postgraduate School, Monterey, CA, USA ; Kevin E. Blaine ; Leonard J. Cirignano ; Guido Ciampi
more authors

Nonuniformity in charge transport properties is a limiting factor in energy resolution of radiation detectors. In this paper, we investigate variations in the low temperature ambipolar diffusion length and the mobility-lifetime (μτ) product in bulk doped TlBr using cathodoluminescence (CL) and transport imaging. One TlBr crystal was doped with sodium (Na), aluminum (Al), and silver (Ag). A second TlBr crystal was doped with copper (Cu), iron (Fe), and zinc (Zn). We report the first low temperature high resolution CL spectroscopy and mapping in bulk doped TlBr, showing spatial variation in recombination luminescence on a scale of ~10 μm. Transport imaging is applied to quantify these variations in TlBr at 5 K. Ambipolar diffusion lengths and μτ products, dominated by the transport of holes, are mapped across a 40 μm segment of TlBr at a resolution of 2 μm. Ambipolar diffusion lengths are found to vary between 4.6 μm and 11.2 μm, on a spatial scale comparable to the variation observed in the CL map.

Published in:

IEEE Transactions on Nuclear Science  (Volume:59 ,  Issue: 5 )