By Topic

A topological approach to failure diagnosis of large-scale systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Ishida, Yoshiteru ; Dept. of Appl. Math. & Phys., Kyoto Univ., Kyoto-shi, Japan ; Adachi, Norihiko ; Tokumaru, H.

A failure diagnosis model which consists of a set of units that are faulty, a set of measurements to detect a faulty unit, and an incidence matrix representing the binary relation between these two sets is presented. A binary relation is defined by whether or not a fault of one unit is detected by a measurement. Considering this failure diagnosis model as a simplicial complex in topological geometry, the relationship between the diagnostic aspects of the model and the topological properties of the corresponding simplicial complex is studied. The diagnosability of a failure diagnosis model with multiple faults is expressed as a covering property of each simplex in a simplicial complex. The capability of distinguishing a faulty unit by a given number of measurement is determined by examining the global connective structure of the simplicial complex. This analysis of connectivity is done by performing q-analysis on a simplicial complex. It is noted hat all possible combinations of fault patterns are considered under a permissible number of faults. However, in actual systems, only restricted fault patterns are possible in which faulty units are functionally connected with each other, even in multiple fault situations.

Published in:

Systems, Man and Cybernetics, IEEE Transactions on  (Volume:SMC-15 ,  Issue: 3 )