Cart (Loading....) | Create Account
Close category search window
 

Metal surface inspection using image processing techniques

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Don, H.-S. ; School of Electrical Engng., Purdue Univ., West Lafayette, IN, USA ; Fu, K.-S. ; Liu, C.R. ; Lin, W.-C.

The feasibility of applying image processing techniques to metal surface inspection is demonstrated. Two methods for metal surface inspection are described. In the first method, the metal surface reflective power and the metal surface normal are related by a random surface scattering model. The metal surface profile can then be computed from the metal surface normal. The second method applies pattern recognition techniques to classify metal surfaces into classes of different roughness. Methods of feature extraction and classification have been tested experimentally and the performances of different types of classifier have been compared. A two-level tree classifier using nonparametric linear classifiers at each node gives better than 90% correct classification on the testing set.

Published in:

Systems, Man and Cybernetics, IEEE Transactions on  (Volume:SMC-14 ,  Issue: 1 )

Date of Publication:

Jan.-Feb. 1984

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.