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Using six-port reflectometer measurement of complex dielectric constant

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1 Author(s)
Xi-Ping, Hu ; National Institute of Metrology, RF and Microwave Laboratory, He Ping Li, Beijing, China

This paper presented the measuring principle of complex dielectric constant using six-port reflectometer and the mathematical model of computer software to perform this measurement. The experiment results of measuring Teflon material using six-port reflectometer at X-band are given. The complex dielectric constant of the same material is measured using the resonant cavity technique. The agreement of two results provides evidence of the validity of this theory.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:IM-36 ,  Issue: 2 )

Date of Publication:

June 1987

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