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Precision millimeter-wave measurements of complex refractive index, complex dielectric permittivity, and loss tangent of common polymers

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1 Author(s)
Afsar, Mohammed Nurul ; Department of Electrical Engineering, The City College of the City University of New York, New York, NY; Massachusetts Institute of Technology, Cambridge, MA 02139

Our improved dispersive Fourier transform technique applied to a polarizing two-beam interferometer enables us to provide high-precision continuous spectra of complex refractive index, complex dielectric permittivity, and loss tangent of polyethylene, polypropylene, poly-4 methyl pentene-1 (TPX), polytetrafluorethylene, Plexiglas, acrylic, and nylon over the frequency range 50–300 GHz. The first four are nonpolar polymers and exhibit extremely low-loss characteristics. The last three are typical polar polymers, but they exhibit nearly 20 to 30 times higher loss compared to nonpolar polymers.

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Instrumentation and Measurement, IEEE Transactions on  (Volume:IM-36 ,  Issue: 2 )