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A computer-controlled high-precision Universal Measuring Machine (UMM) of advanced design is being applied to the calibration of high-precision artifacts in one- and two-dimensional space, aided by checks against master length reference standards. These artifacts, principally step-gages and roundness standards, require ratio-type techniques similar to those employed in calibration of electrical ratio devices. The application is yielding significant time savings and accuracy enhancement. Analytical power of the machine's computer system simplifies data collection, improves computation of results, and permits deterministic analysis where best judgment has been the practice.