By Topic

Precision calibration of phase meters

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Turgel, Raymond S. ; Electrosystems Division, National Bureau of Standards, Gaithersburg, MD 20899 ; Vecchia, D.F.

Using the calibration of a phase meter with a nominally linear response as an example, a statistical approach is discussed for predicting worst-case offsets of the meter response characteristic from the value of the reference standard. A linear calibration curve is used to model the meter response, and statistical tests are described which test the appropriateness of the model and whether the calculated calibration curve differs significantly from the ideal. Various levels of corrections to be applied can then be determined on the basis of these tests, and limits to offsets are calculated for each of the levels. By extending this approach, it is possible to predict limits of uncertainty when using the calibrated meter to make measurements.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:IM-36 ,  Issue: 4 )