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ProperTEST: a portable parallel test generator for sequential circuits

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2 Author(s)
Ramkumar, B. ; Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA ; Banerjee, P.

Parallel algorithms developed for CAD problems today suffer from two important drawbacks. First, they are machine specific, and tend to perform poorly on architectures other than the one for they were designed. Second, the quality of results degrades significantly during parallel execution. In this paper, we address these two problems for an important CAD application: test generation for sequential circuits, We have developed a new parallel test generator, ProperTEST, that is portable across a range of MIMD parallel architectures. This work is part of the ProperCAD project which aims to develop CAD algorithms that run unchanged on shared and nonshared memory machines. We present performance data for ProperTEST on ISCAS 89 sequential circuits on a Sequent Symmetry, an Intel i860 hypercube, an NCUBE/2 hypercube, a network of Sun workstations, and an Encore Multimax. Parallel processing can also be used to improve on the fault coverage possible on one processor in a given amount of time. This was not possible in earlier approaches due to search anomalies. Using ProperTEST, we provide results on ISCAS 89 benchmark programs demonstrating the improvements in fault coverage as the number of processors is increased

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:16 ,  Issue: 5 )