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Surrogate Model-Based Self-Calibrated Design for Process and Temperature Compensation in Analog/RF Circuits

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3 Author(s)
Ting Zhu ; Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA ; Steer, M.B. ; Franzon, P.D.

Analog circuits designed in submicrometer nodes suffer from process variations, typically requiring calibration in order to center their performance parameters and to recover yield loss. This article presents a design flow to find appropriate tuning knob settings to compensate for different process variation scenarios.

Published in:

Design & Test of Computers, IEEE  (Volume:29 ,  Issue: 6 )

Date of Publication:

Dec. 2012

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