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Surrogate Model-Based Self-Calibrated Design for Process and Temperature Compensation in Analog/RF Circuits

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3 Author(s)
Ting Zhu ; Electrical and Computer Engineering, North Carolina State University, Raleigh ; Michael B. Steer ; Paul D. Franzon

Analog circuits designed in submicrometer nodes suffer from process variations, typically requiring calibration in order to center their performance parameters and to recover yield loss. This article presents a design flow to find appropriate tuning knob settings to compensate for different process variation scenarios.

Published in:

IEEE Design & Test of Computers  (Volume:29 ,  Issue: 6 )