Cart (Loading....) | Create Account
Close category search window
 

An efficient algorithm for registration of pre- and intra- operative brain MRI images to correct intensity inhomogeneity

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Kazerooni, A.F. ; Dept. of Med. Phys. & Biomed. Eng., Tehran Univ. of Med. Sci., Tehran, Iran ; Ahmadian, A. ; Saberi, H. ; Alirezaie, J.
more authors

Spatially-varying intensity inhomogeneity is a severe artifact, which occurs in intra-operative MR images of the brain. This artifact causes implications in the accuracy of image guided navigation systems being performed during neurosurgery procedures. Therefore, it is highly desirable to correct intensity inhomogeneity along with registration process to achieve an efficient and adaptive method to the image guided surgery constraints. In this paper, a modified Residual Complexity similarity measure is used to correct this artifact with the registration of pre- and intra-operative images. The results show that this similarity measure outperforms some well-known similarity measures such as NMI and SSD in registration of pre- and intra-operative images of the brain, by 31.5%.

Published in:

Information Science, Signal Processing and their Applications (ISSPA), 2012 11th International Conference on

Date of Conference:

2-5 July 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.