Cart (Loading....) | Create Account
Close category search window

Fabricating high-density magnetic storage elements by low-dose ion beam irradiation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Neb, R. ; Fachbereich Physik and Research Center Optimas, Technische Universität Kaiserslautern, Erwin-Schrödinger-Straße 56, 67663 Kaiserslautern, Germany ; Sebastian, T. ; Pirro, P. ; Hillebrands, B.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

We fabricate magnetic storage elements by irradiating an antiferromagnetically coupled ferromagnetic/nonmagnetic/ferromagnetic trilayer by a low-dose ion beam. The irradiated areas become ferromagnetically coupled and are capable of storing information if their size is small enough. We employ Fe/Cr/Fe trilayers and a 30 keV focused Ga+-ion beam to demonstrate the working principle for a storage array with a bit density of 7  Gbit/in.2. Micromagnetic simulations suggest that bit densities of at least two magnitudes of order larger should be possible.

Published in:

Applied Physics Letters  (Volume:101 ,  Issue: 11 )

Date of Publication:

Sep 2012

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.