Cart (Loading....) | Create Account
Close category search window
 

On the robustness of the fractionally-spaced constant modulus criterion to channel order undermodeling. I

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Endres, T.J. ; Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA ; Anderson, B.D.O. ; Johnson, C.R. ; Green, M.

This paper studies the robustness properties of the constant modulus (CM) criterion specifically when the fractionally-spaced equalizer time span is less than that of the channel. Hence, there necessarily exists an error in the equalized signal. Noiseless, binary signalling is considered. The change in CM cost from a perfect equalization setting is derived for two cases: (i) perturbations to the channel outside the time span of the equalizer, and (ii) equalizer truncation. This CM cost is related to the mean squared error (MSE) cost and a design guideline for length selection is proposed. This guideline is shown by example to be robust when noisy, multi-level complex signalling is considered.

Published in:

Signal Processing Advances in Wireless Communications, First IEEE Signal Processing Workshop on

Date of Conference:

16-18 April 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.