Cart (Loading....) | Create Account
Close category search window
 

Shift Error Analysis in Image Based 3D Skull Feature Reconstruction

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Thi Chau Ma ; Human Machine Interaction Lab., Vietnam Nat. Univ., Hanoi, Vietnam ; The Duy Bui ; Trung Kien Dang

3D skull is crucial in skull-based 3D facial reconstruction [1, 2, 3, 4, 5, 6, 7, 8]. In 3D reconstruction, especially in skull-based 3D facial reconstruction, features usually play an important role. Because, the accuracy in feature detection strongly affects the accuracy of the 3D final model. In this paper, we concentrate on accuracy of 3D reconstructed skull, one important part in skull-based 3D facial reconstruction. We discuss a cause of errors called shift errors when taking sequence of skull images. In addition, we analysis the effect of shift error in 3D reconstruction and propose solution to limit the effect.

Published in:

Knowledge and Systems Engineering (KSE), 2012 Fourth International Conference on

Date of Conference:

17-19 Aug. 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.