By Topic

Self-Learning of Edge-Preserving Single Image Super-Resolution via Contourlet Transform

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Min-Chun Yang ; Dept. Comput. Sci. & Inf. Eng., Nat. Taiwan Univ., Taipei, Taiwan ; De-An Huang ; Chih-Yun Tsai ; Wang, Y.-C.F.

We present a self-learning approach for single image super-resolution (SR), with the ability to preserve high frequency components such as edges in resulting high resolution (HR) images. Given a low-resolution (LR) input image, we construct its image pyramid and produce a super pixel dataset. By extracting context information from the super-pixels, we propose to deploy context-specific contour let transform on them in order to model the relationship (via support vector regression) between the input patches and their associated directional high-frequency responses. These learned models are applied to predict the SR output with satisfactory quality. Unlike prior learning-based SR methods, our approach advances a self-learning technique and does not require the self similarity of image patches within or across image scales. More importantly, we do not need to collect training LR/HR image data in advance and only require a single LR input image. Empirical results verify the effectiveness of our approach, which quantitatively and qualitatively outperforms existing interpolation or learning-based SR methods.

Published in:

Multimedia and Expo (ICME), 2012 IEEE International Conference on

Date of Conference:

9-13 July 2012