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A Fast Ellipse Detection Method in Planar Target Image

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4 Author(s)
Zhang Shengnan ; Shenyang Univ. of Technol., Shenyang, China ; Yang Shuang ; Niu Lianqiang ; Yuan Weiqi

Aim at the target image with high quality and strong regular pattern, a fast ellipse detection method is presented in this paper. According to the topological structure of the target pattern, the method quickly collects edge points and calculates the possible ellipses, then verifies the possible ellipses to further determine the final correct geometric parameters of ellipses by using the ellipse raster conversion process. The proposed method does not depend on edge detection and spatial transformation operation, it significantly reduces the amount of calculation. Experimental results demonstrate that this method not only can guarantee the extraction accuracy, but also meet the requirement of fast on-line detection of the target image.

Published in:

Digital Manufacturing and Automation (ICDMA), 2012 Third International Conference on

Date of Conference:

July 31 2012-Aug. 2 2012