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Radiation hardness assurance categories for COTS technologies

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4 Author(s)
G. L. Hash ; Sandia Nat. Labs., Albuquerque, NM, USA ; M. R. Shaneyfelt ; F. W. Sexton ; P. S. Winokur

A comparison of the radiation tolerance of three commercial and one radiation hardened SRAM is presented for total dose, dose rate, and single event effects environments. The devices are categorized according to radiation hardness within each environment and the necessity of considering all applicable environments is enforced. Burn-in effects on radiation hardness are shown for each of the environments

Published in:

Radiation Effects Data Workshop, 1997 IEEE

Date of Conference:

24 Jul 1997