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Radiation testing results of COTS based space microcircuits

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8 Author(s)
Layton, P. ; Space Electron. Inc., San Diego, CA, USA ; Strobel, D. ; Anthony, H. ; Boss, R.
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We present both heavy ion single event effect (SEE) and total ionizing dose (TID) data collected at Space Electronics Inc. for candidate spacecraft microelectronics

Published in:

Radiation Effects Data Workshop, 1997 IEEE

Date of Conference:

24 Jul 1997