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Device SEE susceptibility from heavy ions (1995-1996)

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9 Author(s)
Nichols, D.K. ; Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA ; Coss, J.R. ; Miyahira, T.F. ; Schwartz, H.R.
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A seventh set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications. SEE trends are indicated for several functional classes of ICs

Published in:

Radiation Effects Data Workshop, 1997 IEEE

Date of Conference:

24 Jul 1997