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Measurement of crosstalk-induced delay errors in integrated circuits

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3 Author(s)
Moll, F. ; Dept. of Electron. Eng., Univ. Politecnica de Catalunya, Barcelona, Spain ; Roca, M. ; Rubio, A.

Coupling between lines may cause a variation in the effective transition delay in a digital signal path if there exists a simultaneous transition in the coupled lines. The authors present a measurement method for this effect, using a specifically designed integrated circuit. It is shown that the effect may produce either an increase or a decrease in the critical path, therefore altering the maximum frequency specification of a synchronous sequential circuit

Published in:

Electronics Letters  (Volume:33 ,  Issue: 19 )