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Browse Journals & Magazines > Journal of Applied Physics ...> Volume:112 Issue:5 Help

Characterization of local piezoelectric behavior of ferroelectric GeTe and Ge2Sb2Te5 thin films

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4 Author(s)
Gervacio-Arciniega, J.J. ; CINVESTAV Unidad Querétaro, Libramiento Norponiente No. 2000, Juriquilla, 76230 Querétaro, Mexico ; Prokhorov, E. ; Espinoza-Beltran, F.J. ; Trapaga, G.

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We studied the ferroelectric properties of GeTe and Ge2Sb2Te5 thin films through the analysis of capacitance-temperature, contact resonance piezoresponse force, resonance tracking piezoresponse force, and switching piezoresponse force microscopy measurements. These alloys are non-typical ferroelectric materials with low electrical resistivity, which makes their ferroelectric properties difficult to investigate by other conventional techniques. On the basis of measurement values of the Curie temperature, ferroelectric domain structure, piezoelectric coefficient d33, and coercive voltage were obtained. For the first time, hysteresis loops, and switching effects of domains under electrical field were observed in chalcogenide materials.

Published in:
Journal of Applied Physics  (Volume:112 ,  Issue: 5 )

Date of Publication: Sep 2012

Page(s):
052018 - 052018-6
ISSN :
0021-8979
Digital Object Identifier :
10.1063/1.4746087
Product Type:
Journals & Magazines
Date of Current Version :
06 September 2012
Issue Date :
Sep 2012

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