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CDM Simulation Based on Tester, Package and Full Integrated Circuit Modeling: Case Study

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3 Author(s)
Abessolo-Bidzo, D. ; NXP Semicond., Nijmegen, Netherlands ; Smedes, T. ; Huitsing, A.J.

The electrostatic discharge (ESD) sensitivity of ICs with respect to the charged-device model (CDM) is strongly dependent on the IC package, the substrate resistivity, and the effectiveness of the ESD protection network. This paper presents a case study of predictive CDM circuit simulation method based on the tester, package, and full IC modeling approach.

Published in:

Electron Devices, IEEE Transactions on  (Volume:59 ,  Issue: 11 )

Date of Publication:

Nov. 2012

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