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Integrated diagnostics for embedded memory built-in self test on PowerPCTM devices

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1 Author(s)
Hunter, C. ; NCSG Core Design Center, Motorola Inc., Austin, TX, USA

Integration of diagnostics with a memory built-in self-test (BIST) allowing both an effective and efficient manufacturing test as well as an effective diagnostic capability is detailed. Detection of failures within a memory are the primary objective of an embedded memory BIST. Inclusion of comprehensive diagnostics, to isolate faults incurred during the manufacturing or design process, are an extension to the memory BISI, further utilizing the existing circuitry and functionality. Detection and diagnosis of failures within an embedded memory can be realized throughout the entire manufacturing process

Published in:

Computer Design: VLSI in Computers and Processors, 1997. ICCD '97. Proceedings., 1997 IEEE International Conference on

Date of Conference:

12-15 Oct 1997