Cart (Loading....) | Create Account
Close category search window
 

Nearly Exact Analytical Formulation of the DNL Yield of the Digital-to-Analog Converter

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Park, H. ; Univ. of California, Los Angeles, CA, USA ; Ken Yang, C.-K.K.

Simple analytical differential nonlinearity (DNL) yield models of an arbitrarily segmented digital-to-analog converter (DAC) are presented. The yield estimation requires the analysis of the correlated DNL variation at each transition of the input code. Instead of using high-order integration of multivariate Gaussian probability density functions, this brief explores a new perspective on the formulation of the DNL yield by selecting essential test codes and by analyzing correlation coefficients between the test codes. Generally, for most DAC designs >; 6 bits, DNL caused by the binary and thermometer groups are equivalently uncorrelated. This statistical independence simplifies the DNL yield model as a multiplication of each section's yield, which involves only separate 1-D integration. We provide behavioral and HSPICE Monte Carlo simulation results that precisely match the yield estimation predicted by our models.

Published in:

Circuits and Systems II: Express Briefs, IEEE Transactions on  (Volume:59 ,  Issue: 9 )

Date of Publication:

Sept. 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.