By Topic

Flux-pinning-induced interfacial shearing and transverse normal stress in a superconducting coated conductor long strip

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
3 Author(s)
Jing, Ze ; Key Laboratory of Mechanics on Disaster and Environment in Western China, Ministry of Education of China, Department of Mechanics and Engineering Science, Lanzhou University, Lanzhou Gan su 730000, People’s Republic of China ; Yong, Huadong ; Youhe Zhou

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.4748338 

In this paper, a theoretical model is proposed to analyze the transverse normal stress and interfacial shearing stress induced by the electromagnetic force in the superconducting coated conductor. The plane strain approach is used and a singular integral equation is derived. By assuming that the critical current density is magnetic field independent and the superconducting film is infinitely thin, the interfacial shearing stress and normal stress in the film are evaluated for the coated conductor during the increasing and decreasing in the transport current, respectively. The calculation results are discussed and compared for the conductor with different substrate and geometry. The results indicate that the coated conductor with stiffer substrate and larger width experiences larger interfacial shearing stress and less normal stress in the film.

Published in:

Journal of Applied Physics  (Volume:112 ,  Issue: 4 )