By Topic

Crack Statistic for Wafer-Based Silicon Solar Cell Modules in the Field Measured by UV Fluorescence

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
M. Köntges ; Institute for Solar Energy Research Hamelin, Germany ; S. Kajari-Schröder ; I. Kunze

We use the fluorescence effect of the lamination material of photovoltaic (PV) modules to detect cracks in wafer-based solar cells in a power plant. For this purpose, the PV modules are irradiated by ultraviolet (UV) light, and the fluorescence light is measured by a camera. The measurement is realized in the dark. This new application of the fluorescence method allows new insight into cracks of a huge amount of PV modules during service life without remounting or touching the PV modules. We found that the frequency distribution of so-called cross cracks is almost homogenous in the PV modules. These cracks are frequently induced by crumbs or needle-shaped production equipment and not introduced after production. We show that the measured distribution of “cross cracks” in the PV modules fits to the binominal frequency distribution, as expected for production-induced cell failures. The measured crack frequency distribution for other crack types is compared with a finite-element simulation of a simplified PV module. We find that the lateral crack distribution correlates with the simulated strain distribution induced by module vibrations. In total, we found that 4.1% of the solar cells in the PV modules show at least one crack.

Published in:

IEEE Journal of Photovoltaics  (Volume:3 ,  Issue: 1 )