Cart (Loading....) | Create Account
Close category search window
 

Addressing the challenge of data interoperability for off-line analysis of distribution networks in the Smart Grid

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
McMorran, A.W. ; Open Grid Syst. Ltd., Glasgow, UK ; Stewart, E.M. ; Shand, C.M. ; Rudd, S.E.
more authors

As utilities move towards a more intelligent, autonomous distribution network with increased penetration of distributed generation there is a requirement for utilities and consultancies to analyze how these changes will affect network operation and performance under varying conditions. This requires a large amount of data and results to be moved on a frequent communications basis between applications from a number of different vendors, all of whom use their own proprietary data formats. This paper will discuss how these challenges are impacting off-line analysis of complex networks and how open standards can enable companies to efficiently share and exchange network models between incompatible applications.

Published in:

Transmission and Distribution Conference and Exposition (T&D), 2012 IEEE PES

Date of Conference:

7-10 May 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.