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Highly accelerated life testing (HALT) was performed on embedded planar capacitors by subjecting these devices to elevated temperature and voltage aging conditions. The dielectric material of these capacitors was a nanocomposite of epoxy and BaTiO3. The objective of HALT was to model the time-to-failure as a function of temperature and voltage using the Prokopowicz model. This involved computing the constants of the Prokopowicz model, voltage exponent (n), and activation energy (Ea) for a nanocomposite of epoxy and BaTiO3. The results of HALT can be used for the qualification of embedded planar capacitors and for further improvement in the material and the manufacturing processes of these capacitors.