By Topic

Highly Accelerated Life Testing of Embedded Planar Capacitors With Epoxy- {\rm BaTiO}_{3} Nanocomposite Dielectric

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Alam, M.A. ; Center for Adv. Life Cycle Eng., Univ. of Maryland, College Park, MD, USA ; Azarian, M.H. ; Pecht, M.G.

Highly accelerated life testing (HALT) was performed on embedded planar capacitors by subjecting these devices to elevated temperature and voltage aging conditions. The dielectric material of these capacitors was a nanocomposite of epoxy and BaTiO3. The objective of HALT was to model the time-to-failure as a function of temperature and voltage using the Prokopowicz model. This involved computing the constants of the Prokopowicz model, voltage exponent (n), and activation energy (Ea) for a nanocomposite of epoxy and BaTiO3. The results of HALT can be used for the qualification of embedded planar capacitors and for further improvement in the material and the manufacturing processes of these capacitors.

Published in:

Components, Packaging and Manufacturing Technology, IEEE Transactions on  (Volume:2 ,  Issue: 10 )