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Aliasing in signature analysis testing with multiple input shift registers

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5 Author(s)

An investigation of the properties of multiple input shift registers for signature analysis is presented. The assumption of independent errors at the register inputs has been used to model the register behavior as a Markov process whose equations have been solved to obtain the exact dependence of aliasing probabilities as a function of test length, input error probabilities, and feedback structure. Some unique featured of maximum-length registers are proven. Accurate simplified expressions of aliasing probability are derived for use as tools in the evaluation of the coverage

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Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:9 ,  Issue: 12 )