Close category search window
 

Using functional fault simulation and the difference fault model to estimate implementation fault coverage

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Silberman, G.M. ; Dept. of Electr. Eng., Technion Israel Inst. of Technol., Haifa, Israel ; Spillinger, I.

An approach to estimate the fault coverage of the implementation of a VLSI design obtained by fault simulation at the function level is presented. The proposed methodology begins by defining a fault model for the functional level, the difference fault model (DFM), which reflects all of the faults in the implementation level. Functional fault detection is recorded by performing a functional simulation of the design, with faults injected as determined by the DFM. The last step is to use the correspondence between the functional faults (in the DFM) and those of the implementation level to yield an estimate of the implementation fault coverage. The results obtained show a very good correlation between the estimated fault coverage, based on fault simulation at the functional level, and the actual fault coverage obtained by fault simulation on a gate-level implementation

Published in:
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:9 ,  Issue: 12 )

Date of Publication: Dec 1990

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.