Cart (Loading....) | Create Account
Close category search window

A 128-Channel, 8.9-ps LSB, Column-Parallel Two-Stage TDC Based on Time Difference Amplification for Time-Resolved Imaging

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Mandai, S. ; Technol. Univ. of Delft, Delft, Netherlands ; Charbon, E.

This paper proposes a 128-channel column-parallel two-stage time-to-digital converter (TDC) utilizing a time difference amplifier (TDA) and shows measurement results obtained from an implementation in a 0.35- μm CMOS process. The first stage operates as a coarse TDC, the time residue is amplified by a TDA, then converted by the second-stage TDC. As the gain of the time difference amplifier can be adjusted from 8.5 to 20.4, the time resolution of the TDC can be tuned from 21.4 to 8.9 ps. The time resolution variation due to process-voltage-temperature (PVT) effects is ± 5.8% without calibration when the time resolution is 12.9 ps. We propose a calibration method to compensate LSB changes due to the power supply fluctuation and temperature variation.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:59 ,  Issue: 5 )

Date of Publication:

Oct. 2012

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.