Cart (Loading....) | Create Account
Close category search window
 

A dynamic latched comparator for low supply voltages down to 0.45 V in 65-nm CMOS

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Yu Lin ; Mixed-signal Microelectron. Group, Eindhoven Univ. of Technol., Eindhoven, Netherlands ; Doris, K. ; Hegt, H. ; van Roermund, A.

This paper presents a dynamic latched comparator suitable for applications with very low supply voltage. It adopts a circuit topology with a separated input stage and two cross-coupled pairs (nMOS and pMOS) stages in parallel instead of stacking them on top of each other as previous works. This circuit topology enables fast operation over a wide input common-mode voltage and supply voltage range. This comparator is designed in 65-nm CMOS technology with standard threshold transistors (VT≈0.4V). Simulation shows that it achieves 5mV sensitivity for a sampling rate of 5GS/s with 1.2V supply voltage, 10mV for 250MS/s with 0.5V supply voltage and 100MS/s with 0.45V supply voltage. The simulated delay time of the proposed comparator is about 30% shorter than the dual-tail dynamic comparator with 0.5V supply voltage and only one third compared to that of the conventional one with 0.6V supply voltage when they are designed to have a similar input referred offset voltage in 65nm CMOS technology.

Published in:

Circuits and Systems (ISCAS), 2012 IEEE International Symposium on

Date of Conference:

20-23 May 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.