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Variation-resilient current-mode logic circuit design using MTJ devices

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3 Author(s)
Youngkeun Kim ; Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan ; Masanori Natsui ; Takahiro Hanyu

A current-mode logic-circuit style using MTJ devices as threshold voltage (Vth) variation compensating elements is proposed for realizing a process-variation-aware VLSI processor with maintaining a higher performance capability. The faulty logic-operation behavior due to Vth variation of each MOS transistor can be neglected by adjusting resistance values of MTJ devices that are connected to the source electrode of MOS transistors in series. By using HSPICE simulation under a 90nm CMOS technology, it is demonstrated that basic current-mode logic gates using the proposed method are robust against the Vth variation.

Published in:

2012 IEEE International Symposium on Circuits and Systems

Date of Conference:

20-23 May 2012