By Topic

Quantification of Optical Deflection by Laser-structured ZnO:Al

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Berner, M. ; Inst. of Photovoltaics, Univ. of Stuttgart, Stuttgart, Germany ; Sämann, M. ; Garamoun, A. ; Schubert, M.B.

A novel camera-based measurement setup fully quantifies the transmitted radiation deflected by textured front electrodes for thin-film solar cells. The conventional measurement of angular intensity distribution only analyzes one polar plane. The new setup examines the optical scattering and/or diffraction over the complete hemisphere. The hemispheric intensity distribution of laser-structured ZnO:Al proves reduced specular transmission and, hence, improved light trapping.

Published in:

Photovoltaics, IEEE Journal of  (Volume:3 ,  Issue: 1 )