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4-π Crosstalk noise model for deep submicron VLSI global RC interconnects

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6 Author(s)
Maheshwari, V. ; Dept. of Electron. & Commun. Eng., Nat. Inst. of Technol. Durgapur, Durgapur, India ; Joshi, N. ; Anushree ; Kar, R.
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This paper presents an improved, highly accurate and efficient complete analytical 4-π crosstalk noise model which incorporates all physical properties such as victim and aggressor drivers, coupling locations in both lines (victim and aggressor) and distributed RC characteristics of on-chip VLSI interconnects. In this paper, various noise avoidance approaches are explained. Sensitivity expressions of parameters to peak noise and noise width are also used in this explanation. The analysis and evaluation of the parameters are done using the proposed model. In the explanation of crosstalk noise model various driver/interconnect parameters are included as done in any sensitivity based noise avoidance approach.

Published in:

Humanities, Science and Engineering Research (SHUSER), 2012 IEEE Symposium on

Date of Conference:

24-27 June 2012