Cart (Loading....) | Create Account
Close category search window

A Study on User's Perception in E-learning Security and Privacy Issues

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
May, M. ; INSA-Lyon, Univ. de Lyon, Lyon, France ; Fessakis, G. ; Dimitracopoulou, A. ; George, S.

Researchers have proven with both theoretical and empirical studies that technologies could enhance learning. Meanwhile, technologies could also create barriers to the latter. Particularly, when the use of technologies causes security and privacy concerns, E-learning becomes less fruitful as the participants are too afraid to be exposed by what has been provided to help them learn in the first place. This paper presents a study on user's perception in using E-learning technologies and the relevant issues. The major contribution of this paper is the awareness-raising of security and privacy issues, which are often overlooked in the research efforts that implicate user tracking and personal data usage for instructional purposes.

Published in:

Advanced Learning Technologies (ICALT), 2012 IEEE 12th International Conference on

Date of Conference:

4-6 July 2012

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.