By Topic

Process and Reliability Sensors for Nanoscale CMOS

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
4 Author(s)

This paper describes the use of sensing schemes that drive on-chip process and aging variation measurements in manufactured silicon.

Published in:

Design & Test of Computers, IEEE  (Volume:29 ,  Issue: 5 )